Difference between revisions of "Process monitoring"
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== Class 4 (30 September) == | |||
<pdfreflow> | <pdfreflow> | ||
class_date = 30 September 2011 [5.3 Mb] | class_date = 30 September 2011 [5.3 Mb] | ||
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* Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | * Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | ||
== Class 5 (07 October) == | |||
<pdfreflow> | <pdfreflow> | ||
Revision as of 00:11, 31 October 2011
Class 4 (30 September)
<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow>
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: http://datasets.connectmv.com/info/ldpe
- Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)
Class 5 (07 October)
<pdfreflow> class_date = 07 October 2011 [1.05 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = Lvm-class-5.pdf </pdfreflow>
- Also print page 2 of this PDF on a full-size page
- Download these CSV files and bring them to class:
- Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
- Raw material characterization: http://datasets.connectmv.com/info/raw-material-characterization
- Tablet spectra data set: http://datasets.connectmv.com/info/tablet-spectra