Difference between revisions of "Process monitoring"
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{{ | {{ClassSidebarYouTube | ||
| date = 30 September and 07 October 2011 | | date = 30 September and 07 October 2011 | ||
| vimeoID1 = | | vimeoID1 = SkRlP0uXeAE | ||
| vimeoID2 = | | vimeoID2 =51IapEl2BhI | ||
| vimeoID3 = | | vimeoID3 =fuATr7A_LS8 | ||
| vimeoID4 = | | vimeoID4 =8JbD-4H9rss | ||
| vimeoID5 = | | vimeoID5 = | ||
| vimeoID6 = | | vimeoID6 = | ||
Revision as of 05:59, 3 January 2017
| Class date(s): | 30 September and 07 October 2011 | ||||
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Class 4 (30 September)
<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow> or you may download the class slides directly.
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: https://openmv.net/info/ldpe
- Wafer thickness: https://openmv.net/info/silicon-wafer-thickness
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)
Class 5 (07 October)
<pdfreflow> class_date = 07 October 2011 [1.05 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = Lvm-class-5.pdf </pdfreflow> or you may download the class slides directly.
- Also print page 2 of this PDF on a full-size page
- Download these CSV files and bring them to class:
- Wafer thickness: https://openmv.net/info/silicon-wafer-thickness
- Raw material characterization: https://openmv.net/info/raw-material-characterization
- Tablet spectra data set: https://openmv.net/info/tablet-spectra