Difference between revisions of "Process monitoring"
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== Class 4 (30 September 2011) == | == Class 4 (30 September 2011) == | ||
[[Media:Lvm-class-4.pdf|Download the class slides]] | |||
[[Image:Nuvola_mimetypes_pdf.png|20px|link=Media:Lvm-class-4.pdf]] [[Media:Lvm-class-4.pdf|Download the class slides]] (PDF) | |||
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** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness | ** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness | ||
* Reading on [ | * Reading on [https://learnche.org/literature/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | ||
== Class 5 (07 October 2011) == | == Class 5 (07 October 2011) == | ||
[[Image:Nuvola_mimetypes_pdf.png|20px|link=Media:Lvm-class-5.pdf]] [[Media:Lvm-class-5.pdf|Download the class slides]] (PDF) | |||
Latest revision as of 14:04, 17 September 2018
| Class date(s): | 30 September and 07 October 2011 | ||||
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Class 4 (30 September 2011)
Download the class slides (PDF)
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: http://openmv.net/info/ldpe
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)
Class 5 (07 October 2011)
Download the class slides (PDF)
- Also print page 2 of this PDF on a full-size page
- Download these CSV files and bring them to class:
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Raw material characterization: http://openmv.net/info/raw-material-characterization
- Tablet spectra data set: http://openmv.net/info/tablet-spectra