Difference between revisions of "Process monitoring"
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== Class | {{ClassSidebarYouTube | ||
| date = 30 September and 07 October 2011 | |||
| vimeoID1 = SkRlP0uXeAE | |||
| vimeoID2 =51IapEl2BhI | |||
| vimeoID3 =fuATr7A_LS8 | |||
| vimeoID4 =8JbD-4H9rss | |||
| vimeoID5 = | |||
| vimeoID6 = | |||
| vimeoID7 = | |||
| vimeoID8 = | |||
| vimeoID9 = | |||
| course_notes_PDF = | |||
| course_notes_alt = Course notes | |||
| overheads_PDF = | |||
| overheads_PDF_alt = Projector notes | |||
| assignment_instructions = | |||
| assignment_solutions = | |||
| video_download_link_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-04C.mp4 | |||
| video_download_link2_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05A.mp4 | |||
| video_download_link3_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05B.mp4 | |||
| video_download_link4_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05C.mp4 | |||
| video_download_link5_MP4 = | |||
| video_download_link6_MP4 = | |||
| video_download_link7_MP4 = | |||
| video_download_link8_MP4 = | |||
| video_download_link9_MP4 = | |||
| video_download_link_MP4_size = 394 Mb | |||
| video_download_link2_MP4_size = 220 Mb | |||
| video_download_link3_MP4_size = 196 Mb | |||
| video_download_link4_MP4_size = 327 Mb | |||
| video_download_link5_MP4_size = Mb | |||
| video_download_link6_MP4_size = Mb | |||
| video_download_link7_MP4_size = Mb | |||
| video_download_link8_MP4_size = Mb | |||
| video_download_link9_MP4_size = Mb | |||
| video_notes1 = | |||
| video_notes2 = | |||
| video_notes3 = | |||
| video_notes4 = | |||
| video_notes5 = | |||
| video_notes6 = | |||
}} | |||
== Class 4 (30 September 2011) == | |||
= | [[Image:Nuvola_mimetypes_pdf.png|20px|link=Media:Lvm-class-4.pdf]] [[Media:Lvm-class-4.pdf|Download the class slides]] (PDF) | ||
* Reading on [ | |||
* | * Also download these 2 CSV files and bring them on your computer: | ||
** LDPE data set: http://openmv.net/info/ldpe | |||
** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness | |||
* Reading on [https://learnche.org/literature/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | |||
== Class 5 (07 October 2011) == | |||
[[Image:Nuvola_mimetypes_pdf.png|20px|link=Media:Lvm-class-5.pdf]] [[Media:Lvm-class-5.pdf|Download the class slides]] (PDF) | |||
* '''Also print''' [[Media:Monitoring-map.pdf | page 2 of this PDF]] on a full-size page | |||
* Download these CSV files and bring them to class: | |||
** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness | |||
** Raw material characterization: http://openmv.net/info/raw-material-characterization | |||
** Tablet spectra data set: http://openmv.net/info/tablet-spectra |
Latest revision as of 14:04, 17 September 2018
Class date(s): | 30 September and 07 October 2011 | ||||
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Class 4 (30 September 2011)
Download the class slides (PDF)
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: http://openmv.net/info/ldpe
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)
Class 5 (07 October 2011)
Download the class slides (PDF)
- Also print page 2 of this PDF on a full-size page
- Download these CSV files and bring them to class:
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Raw material characterization: http://openmv.net/info/raw-material-characterization
- Tablet spectra data set: http://openmv.net/info/tablet-spectra