Difference between revisions of "Process monitoring"

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== Class preparation ==
{{ClassSidebarYouTube
| date = 30 September and 07 October 2011
| vimeoID1 = SkRlP0uXeAE
| vimeoID2 =51IapEl2BhI
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| course_notes_PDF =
| course_notes_alt = Course notes
| overheads_PDF =
| overheads_PDF_alt = Projector notes
| assignment_instructions =
| assignment_solutions =
| video_download_link_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-04C.mp4
| video_download_link2_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05A.mp4
| video_download_link3_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05B.mp4
| video_download_link4_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05C.mp4
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| video_download_link4_MP4_size = 327 Mb
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== Class 4 (30 September 2011) ==


=== Class 4 (30 September) ===
[[Image:Nuvola_mimetypes_pdf.png|20px|link=Media:Lvm-class-4.pdf]] [[Media:Lvm-class-4.pdf|Download the class slides]] (PDF)


* Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now)
 
* We will study the [http://datasets.connectmv.com/info/ldpe LDPE data set] in class using the course software. Please download and bring it with you.
* Also download these 2 CSV files and bring them on your computer:
** LDPE data set: http://openmv.net/info/ldpe
** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
 
* Reading on [https://learnche.org/literature/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now)
 
 
 
== Class 5 (07 October 2011) ==
[[Image:Nuvola_mimetypes_pdf.png|20px|link=Media:Lvm-class-5.pdf]] [[Media:Lvm-class-5.pdf|Download the class slides]] (PDF)
 
 
 
* '''Also print''' [[Media:Monitoring-map.pdf | page 2 of this PDF]] on a full-size page
* Download these CSV files and bring them to class:
** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
** Raw material characterization: http://openmv.net/info/raw-material-characterization
** Tablet spectra data set: http://openmv.net/info/tablet-spectra

Latest revision as of 14:04, 17 September 2018

Class date(s): 30 September and 07 October 2011
Video material (part 1)
Download video: Link (plays in Google Chrome) [394 Mb]


Video material(part 2)
Download video: Link (plays in Google Chrome) [220 Mb]


Video material (part 3)
Download video: Link (plays in Google Chrome) [196 Mb]


Video material (part 4)
Download video: Link (plays in Google Chrome) [327 Mb]

Class 4 (30 September 2011)

Nuvola mimetypes pdf.png Download the class slides (PDF)


  • Reading on process monitoring (skip over the sections on multiblock and batch processes for now)


Class 5 (07 October 2011)

Nuvola mimetypes pdf.png Download the class slides (PDF)