Difference between revisions of "Process monitoring"
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== Class notes == | |||
<pdfreflow> | |||
class_date = 30 September 2011 [5.3 Mb] | |||
button_label = Create my projector slides! | |||
show_page_layout = 1 | |||
show_frame_option = 1 | |||
pdf_file = lvm-class-4.pdf | |||
</pdfreflow> | |||
* Also download these 2 CSV files and bring them on your computer: | |||
** LDPE data set: http://datasets.connectmv.com/info/ldpe | |||
** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness | |||
== Class preparation == | == Class preparation == | ||
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* Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | * Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | ||
Revision as of 16:31, 30 September 2011
Class notes
<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow>
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: http://datasets.connectmv.com/info/ldpe
- Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
Class preparation
Class 4 (30 September)
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)