Difference between revisions of "Process monitoring"
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[[Media:Lvm-class-5.pdf|Download the class slides]] directly. | [[Media:Lvm-class-5.pdf|Download the class slides]] directly. | ||
* '''Also print''' [[Media:Monitoring-map.pdf | page 2 of this PDF]] on a full-size page | * '''Also print''' [[Media:Monitoring-map.pdf | page 2 of this PDF]] on a full-size page | ||
Revision as of 18:57, 7 February 2017
| Class date(s): | 30 September and 07 October 2011 | ||||
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Class 4 (30 September 2011)
Download the class slides directly.
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: http://openmv.net/info/ldpe
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)
Class 5 (07 October 2011)
Download the class slides directly.
- Also print page 2 of this PDF on a full-size page
- Download these CSV files and bring them to class:
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Raw material characterization: http://openmv.net/info/raw-material-characterization
- Tablet spectra data set: http://openmv.net/info/tablet-spectra