Difference between revisions of "Process monitoring"
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| assignment_instructions = | | assignment_instructions = | ||
| assignment_solutions = | | assignment_solutions = | ||
| video_download_link_MP4 = http:// | | video_download_link_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-04C.mp4 | ||
| video_download_link2_MP4 = http:// | | video_download_link2_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05A.mp4 | ||
| video_download_link3_MP4 = http:// | | video_download_link3_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05B.mp4 | ||
| video_download_link4_MP4 = http:// | | video_download_link4_MP4 = http://learnche.mcmaster.ca/media/LVM-2011-Class-05C.mp4 | ||
| video_download_link5_MP4 = | | video_download_link5_MP4 = | ||
| video_download_link6_MP4 = | | video_download_link6_MP4 = | ||
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* Also download these 2 CSV files and bring them on your computer: | * Also download these 2 CSV files and bring them on your computer: | ||
** LDPE data set: http:// | ** LDPE data set: http://openmv.net/info/ldpe | ||
** Wafer thickness: http:// | ** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness | ||
* Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | * Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now) | ||
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* '''Also print''' [[Media:Monitoring-map.pdf | page 2 of this PDF]] on a full-size page | * '''Also print''' [[Media:Monitoring-map.pdf | page 2 of this PDF]] on a full-size page | ||
* Download these CSV files and bring them to class: | * Download these CSV files and bring them to class: | ||
** Wafer thickness: http:// | ** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness | ||
** Raw material characterization: http:// | ** Raw material characterization: http://openmv.net/info/raw-material-characterization | ||
** Tablet spectra data set: http:// | ** Tablet spectra data set: http://openmv.net/info/tablet-spectra | ||
Revision as of 17:41, 25 November 2015
| Class date(s): | 30 September and 07 October 2011 | ||||
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Class 4 (30 September)
<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow> or you may download the class slides directly.
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: http://openmv.net/info/ldpe
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)
Class 5 (07 October)
<pdfreflow> class_date = 07 October 2011 [1.05 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = Lvm-class-5.pdf </pdfreflow> or you may download the class slides directly.
- Also print page 2 of this PDF on a full-size page
- Download these CSV files and bring them to class:
- Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
- Raw material characterization: http://openmv.net/info/raw-material-characterization
- Tablet spectra data set: http://openmv.net/info/tablet-spectra