Process monitoring

Class date(s):	30 September and 07 October 2011
Video material (part 1) Download video: Link (plays in Google Chrome) [394 Mb]
Video material(part 2) Download video: Link (plays in Google Chrome) [220 Mb]
Video material (part 3) Download video: Link (plays in Google Chrome) [196 Mb]
Video material (part 4) Download video: Link (plays in Google Chrome) [327 Mb]

Class 4 (30 September)

<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow> or you may download the class slides directly.

• Also download these 2 CSV files and bring them on your computer:
  • LDPE data set: https://openmv.net/info/ldpe
  • Wafer thickness: https://openmv.net/info/silicon-wafer-thickness

• Reading on process monitoring (skip over the sections on multiblock and batch processes for now)

Class 5 (07 October)

<pdfreflow> class_date = 07 October 2011 [1.05 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = Lvm-class-5.pdf </pdfreflow> or you may download the class slides directly.

• Also print page 2 of this PDF on a full-size page
• Download these CSV files and bring them to class:
  • Wafer thickness: https://openmv.net/info/silicon-wafer-thickness
  • Raw material characterization: https://openmv.net/info/raw-material-characterization
  • Tablet spectra data set: https://openmv.net/info/tablet-spectra