Process monitoring

Class date(s):	30 September and 07 October 2011
Video material (part 1) Download video: Link (plays in Google Chrome) [394 Mb]
Video material(part 2) Download video: Link (plays in Google Chrome) [220 Mb]
Video material (part 3) Download video: Link (plays in Google Chrome) [196 Mb]
Video material (part 4) Download video: Link (plays in Google Chrome) [327 Mb]

Class 4 (30 September 2011)

Download the class slides (PDF)

• Also download these 2 CSV files and bring them on your computer:
  • LDPE data set: http://openmv.net/info/ldpe
  • Wafer thickness: http://openmv.net/info/silicon-wafer-thickness

• Reading on process monitoring (skip over the sections on multiblock and batch processes for now)

Class 5 (07 October 2011)

Download the class slides directly.

• Also print page 2 of this PDF on a full-size page
• Download these CSV files and bring them to class:
  • Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
  • Raw material characterization: http://openmv.net/info/raw-material-characterization
  • Tablet spectra data set: http://openmv.net/info/tablet-spectra