Difference between revisions of "Process monitoring"

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== Class notes ==
== Class notes ==


=== Class 4 (30 September) ===
<pdfreflow>     
<pdfreflow>     
class_date        = 30 September 2011  [5.3 Mb]
class_date        = 30 September 2011  [5.3 Mb]
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** LDPE data set: http://datasets.connectmv.com/info/ldpe
** LDPE data set: http://datasets.connectmv.com/info/ldpe
** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
=== Class 5 (07 October) ===
* Notes coming soon
* Download these CSV files and bring them to class:
** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
** Raw material characterization: http://datasets.connectmv.com/info/raw-material-characterization
** Tablet spectra data set: http://datasets.connectmv.com/info/tablet-spectra


== Class preparation ==
== Class preparation ==

Revision as of 12:19, 7 October 2011

Class notes

Class 4 (30 September)

<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow>

Class 5 (07 October)

Class preparation

Class 4 (30 September)

  • Reading on process monitoring (skip over the sections on multiblock and batch processes for now)