Difference between revisions of "Process monitoring"

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** LDPE data set: http://datasets.connectmv.com/info/ldpe
** LDPE data set: http://datasets.connectmv.com/info/ldpe
** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
* Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now)


=== Class 5 (07 October) ===
=== Class 5 (07 October) ===
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** Raw material characterization: http://datasets.connectmv.com/info/raw-material-characterization
** Raw material characterization: http://datasets.connectmv.com/info/raw-material-characterization
** Tablet spectra data set: http://datasets.connectmv.com/info/tablet-spectra
** Tablet spectra data set: http://datasets.connectmv.com/info/tablet-spectra
== Class preparation ==
=== Class 4 (30 September) ===
* Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now)

Revision as of 12:19, 7 October 2011

Class notes

Class 4 (30 September)

<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow>

  • Reading on process monitoring (skip over the sections on multiblock and batch processes for now)

Class 5 (07 October)