Difference between revisions of "Process monitoring"
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* Notes coming soon | * Notes coming soon | ||
* Print [[Media:Monitoring-map.pdf | page 2 of this PDF]] on a full-size page | |||
* Download these CSV files and bring them to class: | * Download these CSV files and bring them to class: | ||
** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness | ** Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness | ||
** Raw material characterization: http://datasets.connectmv.com/info/raw-material-characterization | ** Raw material characterization: http://datasets.connectmv.com/info/raw-material-characterization | ||
** Tablet spectra data set: http://datasets.connectmv.com/info/tablet-spectra | ** Tablet spectra data set: http://datasets.connectmv.com/info/tablet-spectra | ||
Revision as of 14:41, 7 October 2011
Class notes
Class 4 (30 September)
<pdfreflow> class_date = 30 September 2011 [5.3 Mb] button_label = Create my projector slides! show_page_layout = 1 show_frame_option = 1 pdf_file = lvm-class-4.pdf </pdfreflow>
- Also download these 2 CSV files and bring them on your computer:
- LDPE data set: http://datasets.connectmv.com/info/ldpe
- Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
- Reading on process monitoring (skip over the sections on multiblock and batch processes for now)
Class 5 (07 October)
- Notes coming soon
- Print page 2 of this PDF on a full-size page
- Download these CSV files and bring them to class:
- Wafer thickness: http://datasets.connectmv.com/info/silicon-wafer-thickness
- Raw material characterization: http://datasets.connectmv.com/info/raw-material-characterization
- Tablet spectra data set: http://datasets.connectmv.com/info/tablet-spectra