Difference between revisions of "Process monitoring"

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** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness
** Wafer thickness: http://openmv.net/info/silicon-wafer-thickness


* Reading on [http://literature.connectmv.com/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now)
* Reading on [https://learnche.org/literature/item/31/process-analysis-monitoring-and-diagnosis-using-multivariate-projection-methods process monitoring] (skip over the sections on multiblock and batch processes for now)





Revision as of 15:26, 16 September 2018

Class date(s): 30 September and 07 October 2011
Video material (part 1)
Download video: Link (plays in Google Chrome) [394 Mb]


Video material(part 2)
Download video: Link (plays in Google Chrome) [220 Mb]


Video material (part 3)
Download video: Link (plays in Google Chrome) [196 Mb]


Video material (part 4)
Download video: Link (plays in Google Chrome) [327 Mb]

Class 4 (30 September 2011)

Download the class slides directly.


  • Reading on process monitoring (skip over the sections on multiblock and batch processes for now)


Class 5 (07 October 2011)

Download the class slides directly.